Pattern-Oriented Trace and Log Analysis
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Pattern-Oriented Trace and Log Analysis

About the Bundle

This human-based pattern-oriented trace and log analysis and anomaly detection bundle for software technical support engineers, system and network administrators, software developers and testers, DevOps and DevSecOps, digital forensics and malware analysts, data analysts and data scientists, human-assisted AI, ML and data mining includes a training course about basic analysis patterns and a pattern reference for more advanced analysis patterns.

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About the Books

Accelerated Software Trace Analysis, Revised Edition, Part 1

Fundamentals and Basic Patterns
  • 109

    Pages

  • 100%

    Complete

  • PDF

  • EPUB

This book is a revised edition of the original Accelerated Windows Software Trace Analysis training course. General trace and log analysis pattern language covers any execution artifact from a small debugging trace to a distributed log with billions of messages from hundreds of computers, thousands of software components, threads, and processes. It also allows the application of uniform diagnostics and anomaly detection across diverse software environments, troubleshooting and debugging Windows, Mac OS X, Linux, Android, iOS, and any other possible computer platform including networking and IoT. Part 1 covers fundamentals and explains more than 60 basic trace and log analysis patterns, which are now cross-referenced in this improved and less Windows-centric edition. It can also serve as a reference.

Trace, Log, Text, Narrative

An Analysis Pattern Reference for Data Mining, Diagnostics, Anomaly Detection, Fourth Edition
  • 349

    Pages

  • 100%

    Complete

  • PDF

General trace and log analysis patterns allow the application of uniform diagnostics and anomaly detection across diverse software environments. This pattern language covers any execution artifact from a small debugging trace to a distributed log with billions of messages from hundreds of computers, thousands of software components, threads, and processes. Pattern-oriented trace and log analysis is applicable to troubleshooting and debugging Windows, Mac OS X, Linux, FreeBSD, Android, iOS, z/OS, and any other possible computer platform including networking and IoT. Its pattern catalog is a part of pattern-oriented software data analysis, diagnostics, anomaly detection, forensics, prognostics, root cause analysis, and debugging developed by Software Diagnostics Institute (DumpAnalysis.org + TraceAnalysis.org). Also, the scope of applicability of such analysis patterns is much wider than just software execution artifacts or temporal data and now includes general data, narratives, text, and image analysis (space-like narratology). This reference reprints with corrections almost 200 patterns originally published in Memory Dump Analysis Anthology volumes 3 - 13 and Software Diagnostics Library (former Crash Dump Analysis blog, DumpAnalysis.org/blog). It also includes additional 5 analysis patterns from the forthcoming volume 14 bringing the total analysis pattern count to 201. Full-color diagrams accompany almost all pattern descriptions. The fourth edition includes 24 more patterns, updated classification, the bibliography, and the list of narratological and mathematical influences.

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